A device under test (DUT), also known as equipment under test (EUT) and unit under test (UUT), is a manufactured product undergoing testing, either at first manufacture or later during its life cycle as part of ongoing functional testing and calibration checks. This can include a test after repair to establish that the product is performing in accordance with the original product specification. WebDepartment of Electronic and Computer Engineering, DUT Block S8, Level 3, Steve Biko Campus, Steve Biko Road, Durban 4001. Postal Address: PO Box 1334 Durban, KwaZulu …
Functional testing (manufacturing) - Wikipedia
WebDUT may refer to: . Education. Da Nang University of Technology, in Vietnam; Dalian University of Technology, in China; Delft University of Technology, in the Netherlands; … WebThe de-embedding of measurement fixtures is relevant for an accurate experimental characterization of radio frequency and digital electronic devices. The standard technique … rbs cyclery franklin
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WebFeb 10, 2015 · Device Under Test: A device under test (DUT) is a device that is tested to determine performance and proficiency. A DUT also may be a component of a bigger module or unit known as a unit under test (UUT). A DUT is checked for defects to make sure the device is working. The testing is designed to prevent damaged devices from entering … http://www.interfacebus.com/Glossary-of-Terms-DUT-circuits.html WebSep 7, 2024 · I am able to get 90-95% of the energy in the capacitor to the DUT using a IRLB8721PBF MOSFET. Datasheet here - VDS - 30V, Ids - 62A, RDson - 9 mOhm, Qg - 8nC. The DUT (and a ) are in series between the capacitor and the drain of the MOSFET (low side switching). The source of the MOSFET is connected to 0 V. See schematic. rbs wigan branch